Virtual Reference Interferometry: Theory & Experiment

This thesis introduces the idea that a simulated interferogram can be used as a reference for an interferometer. This new concept represents a paradigm shift from the conventional thinking, where a reference is the phase of a wavefront that traverses a known path. The simulated interferogram used as a reference is called a virtual reference. This thesis develops the theory of virtual reference interferometry and uses it for the characterization of chromatic dispersion in short length (<1m) fibers and optical components. Characterization of chromatic dispersion on short length fiber and optical components is a very difficult challenge. Accurate measurement of first and second order dispersion is important for applications from optical component design to nonlinear photonics, sensing and communications. Techniques for short-length dispersion characterization are therefore critical to the development of many photonic systems. The current generation of short-length dispersion measurement techniques are either easy to operate but lack sufficient accuracy, or have sufficient accuracy but are difficult to operate. The use of a virtual reference combines the advantages of these techniques so that it is both accurate and easy to operate. Chromatic dispersion measurements based on virtual reference interferometry have similar accuracy as the best conventional measurement techniques due to the ability to measure first and second order dispersion directly from the interference pattern. Unique capabilities of virtual reference interferometry are demonstrated, followed by a derivation of the operational constraints and system parameters. The technique is also applied to the characterization of few-mode fibers, a hot topic in telecommunications research where mode division multiplexing promises to expand network bandwidth. Also introduced is the theory of dispersive virtual reference interferometry, which can be used to overcome the bandwidth limitations associated with the measurement of near-zero dispersion-length optical components via